Accounting for Location Measurement Error in Atomic Resolution Images of Crystalline Materials

Last updated on Jan 29, 2020
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Developed a method to address measurement error in finding atom column locations in STEM images. Measurement error causes underestimation of effects of interest. This method outperforms current methods that don’t account for this error. Paper in review, with preprint here.

spatial statistics Bayesian hierarchical modeling scanning transmission electron microscopy (STEM) image analysis
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Matt Miller
Data Scientist

I work with software engineers and other stakeholders to create better products through data-driven decsions.